| AIP | hot isostatic presses, cold isostatic presses, sintering systems, high temp furnaces |
| ANTER | thermal conductivity measuring systems, dilatometers, thermo physical testing equipment, thermal conductivity and diffusivity meters |
| OPTRONIS | streak cameras, XR cameras, high speed cameras, intensified systems |
| SCANTRON | 3D surface profiling and topography, non-contact profilometer, non-contact profilometry and laser profiling systems, non-contact thickness and width measuring systems, non-contact laser micrometers for diameter measurement, non-contact distance & displacement measurement, non-contact length & velocity measurement, non contact 3D profilometry, non contact flatness and shape measurement, non contact surface profilometry |
| SPECS | MBE and surface analysis components and systems including: ESCA, XPS, UPS, ISS, AES/SAM, EELS, SIMS, SNMS, HREELS, LEED, RHEED, ARUPS, ARXPS, PEEM, LEEM, AES, SAM ESCA, XR, RF, plasma and UV sources, electron and ion guns, ErLEED, hemispherical electron analyzer, SEM, SNMS, TDS, LT-STM, effusion cells, K-cells, accelerator components, beam-lines for synchrotron radiation facilities, monochromators for hard and soft XR, electron time of flight spectrometer |
Valley Research Does Work As Distributor With Many Other Manufacturers in Asia, Europe and NorthAmerica.
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