| ANATECH | sputtering systems, plasma ashers, plasma etchers, plasma cleaning systems, RIE reactive etching systems |
| BEDE | high resolution XR diffractometers, X-ray Reflectivity, X-Ray Fluorescence, X-ray diffraction imaging |
| BREWER SCIENCE | spin coaters, carbon nanotube coating, waferbond, antireflective coating, benchtop spin coat, planarization system |
| FILMETRICS | thin film thickness meters (ex-situ and in-situ), etch monitor, thickness mapping, metrology system |
| FISCHIONE | ion milling, electropolishers, specimen punch, TEM sample preparation equipment, plasma cleaner, high angle annular dark field STEM detector, SEM & TEM accessories, grinder, disk cutter, nano mill, dark field detector, cryo can, dimpling grinder |
| GATAN | TEM sample preparation and imaging, TEM CCD, ion beam milling, specimen holders, SEM cryotransfer, cathodoluminescence, SEM cold stage, heating stage, 3D view imaging, X-ray microscopy |
| HUNTINGTON MECHANICAL LABORATORIES | UHV chambers, UHV micromanipulators, UHV components (valves, feedthroughs, flanges, load locks, fittings, windows, gages), PLD, pulsed laser deposition systems |
| IONTOF | time-of-flight secondary ion mass spectrometers (TOF-SIMS) for surface analysis, low energy ion scattering instruments |
| MEIVAC | magnetron sputtering guns, high temperature substrate heaters, vacuum throttle valves, power supplies |
| NT-MDT | AFM, SPM systems, SNOM, Raman |
| OXFORD APPLIED RESEARCH | thin film deposition and measurement systems: atom, ion sources and electron sources, mini e- beam evaporators, nanocluster sources, gas dosers, magnetrons, piezoelectric leak valves, ion milling systems, SMOLED evaporation system for glovebox operation, mass spectrometer |
| PLASSYS | CVD, PECVD, evaporation [resistive/ e-beam], plasma ashing, ion milling, sputtering systems, plasma etching |
| SCANTRON | 3D surface profiling and topography, non-contact profilometer, non-contact profilometry and laser profiling systems, non-contact thickness and width measuring systems, non-contact laser micrometers for diameter measurement, non-contact distance & displacement measurement, non-contact length & velocity measurement, non contact 3D profilometry, non contact flatness and shape measurement, non contact surface profilometry |
| SPECS | MBE and surface analysis components and systems including: ESCA, XPS, UPS, ISS, AES/SAM, EELS, SIMS, SNMS, HREELS, LEED, RHEED, ARUPS, ARXPS, PEEM, LEEM, AES, SAM ESCA, XR, RF, plasma and UV sources, electron and ion guns, ErLEED, hemispherical electron analyzer, SEM, SNMS, TDS, LT-STM, effusion cells, K-cells, accelerator components, beam-lines for synchrotron radiation facilities, monochromators for hard and soft XR, electron time of flight spectrometer |
| VSW | XPS, UV, XR sources, systems for surface analysis (ESCA, XPS, UPS, Auger, ISS) |
| ZYVEX | nanomanipulator, nanoprobes, nanomanipulator system for EM, semiconductor failure analysis |
Valley Research Does Work As Distributor With Many Other Manufacturers in Asia, Europe and NorthAmerica.
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