| ACTON RESEARCH | monochromators, Optical Components, spectrographs, Raman spectrometers, UV/excimer/Nd:YAG optics |
| ANATECH | sputtering systems, plasma ashers, plasma etchers, plasma cleaning systems, RIE reactive etching systems |
| BEDE | high resolution XR diffractometers, X-ray Reflectivity, X-Ray Fluorescence, X-ray diffraction imaging |
| BREWER SCIENCE | spin coaters, carbon nanotube coating, waferbond, antireflective coating, benchtop spin coat, planarization system |
| DEL MAR PHOTONICS | femtosecond Lasers, Ti:Sa lasers, femtosecond oscillators, Cr:forsterite femtosecond lasers, Cr:forsterite amplifiers, multipass Ti:Sa amplifier, femtosecond autocorrelators, SPDER systems, femtosecond pulse profiling system, terawatt lasers, optical rotators and isolators, Faraday isolators, harmonic generators |
| DESERT CRYOGENICS | cryogenic probe stations for wafer and microwave testing, superconducting magnets |
| ENWAVE OPTRONICS | Raman spectrometers and analyzers, lasers for Raman, NIR compact Raman spectrometer for nanotube analysis |
| FISCHIONE | ion milling, electropolishers, specimen punch, TEM sample preparation equipment, plasma cleaner, high angle annular dark field STEM detector, SEM & TEM accessories, grinder, disk cutter, nano mill, dark field detector, cryo can, dimpling grinder |
| GATAN | TEM sample preparation and imaging, TEM CCD, ion beam milling, specimen holders, SEM cryotransfer, cathodoluminescence, SEM cold stage, heating stage, 3D view imaging, X-ray microscopy |
| HALCYONICS | active vibration isolation systems, benchtop isolators, isolation patforms, laboratory tables, workstation systems |
| HUNTINGTON MECHANICAL LABORATORIES | UHV chambers, UHV micromanipulators, UHV components (valves, feedthroughs, flanges, load locks, fittings, windows, gages), PLD, pulsed laser deposition systems |
| HYBOND | wire/ribbon bonders, die bonders (manual or semi automatic), peg bonders, dynamic force measurers, calibration systems, work stages, work platforms, beam lead diode bonders |
| IONTOF | time-of-flight secondary ion mass spectrometers (TOF-SIMS) for surface analysis, low energy ion scattering instruments |
| MICROMANIPULATOR | manual stage probing station, motorized stage probing station, microwave probing station, DC probing station, RF probing station, probe card holders, emission microscope systems, laser and ultrasonic cutters, marking systems, vibration isolation system, MEMS system, light/EMI/RFI/moisture shields |
| NT-MDT | AFM, SPM systems, SNOM, Raman |
| OLIS | time resolved spectrometry, rapid scanning fluorescence spectrophotometers, circular dichroism CD spectrophotometers, absorbance and fluorescence stopped-flow systems, modernization of classic UV-VIS, NIR and CD spectrophotometers, Circularly Polarized Luminescence spectrometer, CPL spectrometer, NIR spectrophotometer for nanotube analysis |
| OPTICAL ASSOCIATES OAI | mask aligners, four-point resistivity meters, photolithography UV instruments, UV ozone cleaning system, wafer bonder, radiometers, solar simulator |
| OPTONOR | measurement systems based on Interferometry, holography, shearography, structured Illumination, MEMS, interferometric vibrometer, stress & strain measurement, non-destructive testing by dynamic/static loading, fringe projection systems |
| OXFORD APPLIED RESEARCH | thin film deposition and measurement systems: atom, ion sources and electron sources, mini e- beam evaporators, nanocluster sources, gas dosers, magnetrons, piezoelectric leak valves, ion milling systems, SMOLED evaporation system for glovebox operation, mass spectrometer |
| PLASSYS | CVD, PECVD, evaporation [resistive/ e-beam], plasma ashing, ion milling, sputtering systems, plasma etching |
| SCANTRON | 3D surface profiling and topography, non-contact profilometer, non-contact profilometry and laser profiling systems, non-contact thickness and width measuring systems, non-contact laser micrometers for diameter measurement, non-contact distance & displacement measurement, non-contact length & velocity measurement, non contact 3D profilometry, non contact flatness and shape measurement, non contact surface profilometry |
| T-TECH | IC PCB boards prototyping equipment |
| TMC | vibration isolation tables, vibration isolation platforms, optical tables, AFM table top platforms, SEM/TEM floor platforms |
| ZYVEX | nanomanipulator, nanoprobes, nanomanipulator system for EM, semiconductor failure analysis |
Valley Research Does Work As Distributor With Many Other Manufacturers in Asia, Europe and NorthAmerica.
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